By Takashi Nakamura, Eishi Yahagi, Hideaki Kameyama, Mamoru Baba
Terrestrial neutron-induced delicate blunders in semiconductor reminiscence units are presently a big difficulty in reliability matters. knowing the mechanism and quantifying soft-error premiums are essentially an important for the layout and caliber insurance of semiconductor reminiscence units.
This booklet covers the correct up to date themes in terrestrial neutron-induced smooth error, and goals to supply succinct wisdom on neutron-induced tender blunders to the readers by way of featuring a number of priceless and distinct gains.
Contents: Terrestrial Neutron Spectrometry and Dosimetry; Irradiation trying out within the Terrestrial box; Neutron Irradiation try amenities; assessment and dialogue of Experimental information; Monte Carlo Simulation tools; Simulation effects and Their Implications; overseas Standardization of the Neutron try out approach; precis and demanding situations.